SiPM Characterisation for ePIC
The single home for the SiPM characterisation behind the ePIC dRICH — the lab work most of my research is built on. It consolidates, organised by measurement type, what used to be scattered across a handful of one-off repositories.
What’s inside
- Electrical / dark characterisation — IV curves, dark-count rate (DCR), gain, breakdown voltage (
Vbd), threshold scans, and their temperature / annealing dependence. - Complementary measurements — laser-based timing and photon-detection efficiency (PDE), ALCOR µ-readout fine-tune calibration and noise, slew-rate / TDC studies.
- Acquisition — Keithley source-meter DAQ scripts, kept next to the analysis they feed.
- Irradiation modelling — a Geant4 NIEL simulation for the radiation-damage studies.
Each top-level directory is one measurement or stage: they share sensors and conventions but otherwise run independently, so the whole characterisation chain lives in one versioned tree.
Built with
ROOT / C++ for the analysis, Python for the DAQ, Geant4 for the irradiation modelling. Full documentation is published at https://nikolajal.github.io/sipm-characterisation/.