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epic-drich-beam-test-analysis
ePIC dRICH beam test analysis framework
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Pairs a device ID with a bitmask (used for dead and participant masks). More...
#include <alcor_spilldata.h>
Public Attributes | |
| uint8_t | device |
| Device (ALCOR chip) identifier. | |
| uint32_t | mask |
| Bitmask encoding channel states (e.g. alive/dead). | |
Pairs a device ID with a bitmask (used for dead and participant masks).
Compact, flat representation suitable for ROOT TTree serialisation, as ROOT cannot natively branch a std::map.