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epic-drich-beam-test-analysis
ePIC dRICH beam test analysis framework
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Plain data container for a single ALCOR hit. More...
#include <alcor_data.h>
Public Attributes | |
| int | device |
| Readout device ID (192–207 for known PDUs) | |
| int | fifo |
| FIFO number within the device. | |
| int | type |
| Hit type code — see alcor_hit_struct. | |
| int | counter |
| Event counter from the DAQ stream. | |
| int | column |
| Column address within the ALCOR chip (0–7) | |
| int | pixel |
| Pixel address within the column (0–3) | |
| int | tdc |
| TDC sub-channel index (0–3) | |
| int | rollover |
| Coarse-clock rollover count (each rollover = 32 768 cc) | |
| int | coarse |
| Coarse timestamp within the current rollover (cc) | |
| int | fine |
| Fine-time bin from the TDC (converted to ns via calibration) | |
| uint32_t | hit_mask |
| Bit-field of processing flags — see hit_mask. | |
Plain data container for a single ALCOR hit.
This struct is intentionally kept trivial:
It represents exactly what is stored/read from a ROOT TTree or decoded from the DAQ stream.