epic-drich-beam-test-analysis
ePIC dRICH beam test analysis framework
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alcor_data_struct Struct Reference

Plain data container for a single ALCOR hit. More...

#include <alcor_data.h>

Public Attributes

int device
 Readout device ID (192–207 for known PDUs)
 
int fifo
 FIFO number within the device.
 
int type
 Hit type code — see alcor_hit_struct.
 
int counter
 Event counter from the DAQ stream.
 
int column
 Column address within the ALCOR chip (0–7)
 
int pixel
 Pixel address within the column (0–3)
 
int tdc
 TDC sub-channel index (0–3)
 
int rollover
 Coarse-clock rollover count (each rollover = 32 768 cc)
 
int coarse
 Coarse timestamp within the current rollover (cc)
 
int fine
 Fine-time bin from the TDC (converted to ns via calibration)
 
uint32_t hit_mask
 Bit-field of processing flags — see hit_mask.
 

Detailed Description

Plain data container for a single ALCOR hit.

This struct is intentionally kept trivial:

  • No logic
  • No ownership semantics
  • ROOT-friendly layout

It represents exactly what is stored/read from a ROOT TTree or decoded from the DAQ stream.


The documentation for this struct was generated from the following file: